“Traceability and Support of Modeling & Simulation usingSSP-Traceability Layered Standard”
Dag Brück, Hans-Martin Heinkel, Pierre Mai, Peter Lobner, Antoine VandammeFeedback is a valuable tool for speakers to improve their content and presentation. Even short feedback can prove valuable to a speaker! Please take the time and communicate your thoughts in a constructive way. Thanks, we (and our speakers) appreciate your feedback!