In the last decades, X-ray computer tomography (XRT) has become an important examination technique in the materials science with a wide range of applications. XRT is a non-destructive and noncontact testing method that provides the investigation of external structures as well as three-dimensional insights into the volume of objects. Due to this benefits, XRT application still exhibits increasing importance and expansion of its research field.
This work presents the opportunities and advantages of XRT technology in the characterization and determination of material specifics of refractory materials. Based on several examples, it is demonstrated how different types of X-ray tubes enable measurements from nano to micro scale. The use of the high-resolution nanofocus tube allows the observation of small samples with a resolution down to 0.5 µm, while the high-power microfocus tube permits the penetration of large and dense samples.
In addition to the well-known function of XRT to determine the quality of prototypes or components with regard to geometrical correctness or defects such as pores and cracks, it is demonstrated, how the view into the volume helps to answer scientific questions in the field of refractories. The ability to perform non-destructive testing combined with extensive graphical analysis allows the examination of multi-step test series with a single specimen. This enables the observation of the progression in damaging or corrosion processes, which in turn leads to a better understanding of the relationship between materials properties and structural phenomena.